circuit testing
preferred label: آزمون مدار @fa
type: Concept
narrower: integrated circuit testing

fault simulation
preferred label: شبیه‌سازی عیب @fa
type: Concept
related: integrated circuit testing

electron beam testing
preferred label: آزمون با باریکه الکترون @fa
type: Concept
related: integrated circuit testing

integrated circuit testing
type: Concept
related: integrated circuit measurement
related: design for testability
related: boundary scan testing
related: life testing
related: fault simulation
related: automatic test pattern generation
related: built-in self test
related: integrated circuit
related: electron beam testing
related: OBIC
broader: circuit testing
alternative label: in-circuit testing
preferred label: آزمون مدار مجتمع @fa

integrated circuit measurement
preferred label: اندازه‌گیری مدار مجتمع @fa
type: Concept
related: integrated circuit testing

design for testability
preferred label: طراحی برای آزمون‌پذیری @fa
type: Concept
related: integrated circuit testing

boundary scan testing
preferred label: آزمایش پویش کرانی @fa
type: Concept
related: integrated circuit testing

life testing
preferred label: آزمون عمر مفید @fa
type: Concept
related: integrated circuit testing

automatic test pattern generation
preferred label: تولید الگوی آزمون خودکار @fa
type: Concept
related: integrated circuit testing

built-in self test
preferred label: خودآزمایی توکار @fa
type: Concept
related: integrated circuit testing

integrated circuit
preferred label: مدار مجتمع @fa
type: Concept
related: integrated circuit testing

OBIC
preferred label: جریان القایی باریکه نوری @fa
type: Concept
related: integrated circuit testing