printed circuit design
preferred label: طراحی مدار چاپی @fa
type: Concept
related: design for testability

design for manufacture
preferred label: طراحی برای ساخت @fa
type: Concept
related: design for testability

integrated circuit testing
preferred label: آزمون مدار مجتمع @fa
type: Concept
related: design for testability

design for testability
type: Concept
related: integrated circuit testing
related: printed circuit design
related: electronic equipment testing
related: design for manufacture
related: built-in self test
related: integrated circuit design
related: automatic test pattern generation
related: automatic testing
related: circuit CAD
related: printed circuit testing
related: logic testing
related: application specific integrated circuit
related: logic design
scope note: DFT (design)
preferred label: طراحی برای آزمون‌پذیری @fa
broader: design engineering
alternative label: DFT (design)

electronic equipment testing
preferred label: آزمون تجهیزات الکترونیکی @fa
type: Concept
related: design for testability

built-in self test
preferred label: خودآزمایی توکار @fa
type: Concept
related: design for testability

integrated circuit design
preferred label: طراحی مدار مجتمع @fa
type: Concept
related: design for testability

automatic test pattern generation
preferred label: تولید الگوی آزمون خودکار @fa
type: Concept
related: design for testability

automatic testing
preferred label: آزمون خودکار @fa
type: Concept
related: design for testability

circuit CAD
preferred label: طراحی رایانه‌ای مدار @fa
type: Concept
related: design for testability

printed circuit testing
preferred label: آزمون مدار چاپی @fa
type: Concept
related: design for testability

logic testing
preferred label: آزمون منطقی @fa
type: Concept
related: design for testability

application specific integrated circuit
preferred label: مدار مجتمع کاربرد ویژه @fa
type: Concept
related: design for testability

logic design
preferred label: طراحی منطقی @fa
type: Concept
related: design for testability

design engineering
preferred label: مهندسی طراحی @fa
type: Concept
narrower: design for testability