@prefix skos: <http://www.w3.org/2004/02/skos/core#> .

<http://www.irandoc.acir/onto/irandoc/INSP000944>
  skos:prefLabel "آزمون افزار نیم‌رسانا"@fa, "semiconductor device testing"@en ;
  a <http://www.irandoc.ac.ir/onto/irandoc-meta/Concept>, skos:Concept ;
  skos:related <http://www.irandoc.acir/onto/irandoc/INSP000959> .

<http://www.irandoc.acir/onto/irandoc/INSP000947>
  skos:prefLabel "آزمون مدار مجتمع"@fa, "integrated circuit testing"@en ;
  a <http://www.irandoc.ac.ir/onto/irandoc-meta/Concept>, skos:Concept ;
  skos:related <http://www.irandoc.acir/onto/irandoc/INSP000959> .

<http://www.irandoc.acir/onto/irandoc/INSP0006993>
  skos:prefLabel "دوام"@fa, "durability"@en ;
  a <http://www.irandoc.ac.ir/onto/irandoc-meta/Concept>, skos:Concept ;
  skos:related <http://www.irandoc.acir/onto/irandoc/INSP000959> .

<http://www.irandoc.acir/onto/irandoc/INSP0002936>
  skos:prefLabel "اطمینان‌پذیری"@fa, "reliability"@en ;
  a <http://www.irandoc.ac.ir/onto/irandoc-meta/Concept>, skos:Concept ;
  skos:related <http://www.irandoc.acir/onto/irandoc/INSP000959> .

<http://www.irandoc.acir/onto/irandoc/INSP000959>
  skos:related <http://www.irandoc.acir/onto/irandoc/INSP000944>, <http://www.irandoc.acir/onto/irandoc/INSP000947>, <http://www.irandoc.acir/onto/irandoc/INSP0002915>, <http://www.irandoc.acir/onto/irandoc/INSP0006993>, <http://www.irandoc.acir/onto/irandoc/INSP000952>, <http://www.irandoc.acir/onto/irandoc/INSP000946>, <http://www.irandoc.acir/onto/irandoc/INSP0002936>, <http://www.irandoc.acir/onto/irandoc/INSP000943> ;
  a skos:Concept, <http://www.irandoc.ac.ir/onto/irandoc-meta/Concept> ;
  skos:altLabel "accelerated testing"@en ;
  skos:prefLabel "life testing"@en, "آزمون عمر مفید"@fa ;
  skos:broader <http://www.irandoc.acir/onto/irandoc/INSP000999> .

<http://www.irandoc.acir/onto/irandoc/INSP000943>
  skos:prefLabel "آزمون لامپ الکترونی"@fa, "electron tube testing"@en ;
  a <http://www.irandoc.ac.ir/onto/irandoc-meta/Concept>, skos:Concept ;
  skos:related <http://www.irandoc.acir/onto/irandoc/INSP000959> .

<http://www.irandoc.acir/onto/irandoc/INSP000952>
  skos:prefLabel "آزمون تجهیزات الکترونیکی"@fa, "electronic equipment testing"@en ;
  a <http://www.irandoc.ac.ir/onto/irandoc-meta/Concept>, skos:Concept ;
  skos:related <http://www.irandoc.acir/onto/irandoc/INSP000959> .

<http://www.irandoc.acir/onto/irandoc/INSP000946>
  skos:prefLabel "آزمون دستگاه الکترونی"@fa, "electron device testing"@en ;
  a <http://www.irandoc.ac.ir/onto/irandoc-meta/Concept>, skos:Concept ;
  skos:related <http://www.irandoc.acir/onto/irandoc/INSP000959> .

<http://www.irandoc.acir/onto/irandoc/INSP0002915>
  skos:prefLabel "ارزیابی عمر باقی‌مانده"@fa, "remaining life assessment"@en ;
  a <http://www.irandoc.ac.ir/onto/irandoc-meta/Concept>, skos:Concept ;
  skos:related <http://www.irandoc.acir/onto/irandoc/INSP000959> .

<http://www.irandoc.acir/onto/irandoc/INSP000999>
  skos:prefLabel "آزمون"@fa, "testing"@en ;
  a <http://www.irandoc.ac.ir/onto/irandoc-meta/Concept>, skos:Concept ;
  skos:narrower <http://www.irandoc.acir/onto/irandoc/INSP000959> .